P.S. Ho, C.Y. Li
Description
The aim of this text of stress-induced phenomena in metallization is to assess the current understanding of the problems, to discuss the implications
...
for the reliability of future devices, and to identify needs and directions for future research.
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Genres
Science & Technology
Tags
Science
Physics
Atomic & Molecular
Condensed Matter
Reading Moods
No reading moods specified
Contributors
No contributors specified
Publishing Info
Publisher
American Inst. of Physics
Month-Year
Apr, 2000
ISBN
ISBN-13: 9781563962516
ISBN-10: 1563962519
Language
English
No. of Pages
302
Format
Hardcover
Awards & Recognition
No awards specified
Available at
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